Investigating the Morphology and Dielectric Characteristics of Copper-Zinc-Iron Sulphide Nano-Films for Electronic Applications
Keywords:
Band gap, Deposition, Optical, Thin film, WavelengthAbstract
This study examined the deposition of copper zinc iron sulphide (CZFS) thin films on glass substrates at ambient temperature using the chemical bath deposition (CBD) method. The deposited CZFS thin films were analyzed employing transmission electron microscopy (TEM) and UV-visible spectroscopy. Morphological analyses demonstrated that the CZFS films deposited over different durations exhibited crystallization with varying grain structures. The optical properties, such as the imaginary and real parts of the dielectric constant, loss angle, surface energy loss function (SELF), and volume energy loss function (VELF), were computed using UV-Vis spectroscopic data. Furthermore, the band gap was ascertained through absorption spectrum fitting (ASF). The band gap of the material varied from 0.99 to 1.55 eV, corresponding to increasing deposition durations of the films. These results suggest that the chemical bath deposited CZFS films can be engineered for a range of electronic applications.
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